INVITED SPEAKERS

KEYNOTE SPEAKERS:
Ernest Wu (IBM): “Facts and Myths of Dielectric Breakdown Processes”
Shinichi Takagi (Univ. Tokyo): “Importance of semiconductor MOS interface control on advanced electron devices”

INVITED SPEAKERS:

Takuji Hosoi (Osaka Univ.)
Tuo-Hung Hou (National Chiao Tung Univ.)
Yoshihiro Irokawa (NIMS)
Daigo Kikuta (Toyota Central Labs.)
Kohsuke Nagashio (Univ. Tokyo)
Tomonori Nishimura (Univ. Tokyo)
Takayoshi Shimura (Osaka Univ.)
Yuji Takakuwa (Tohoku Univ.)
Tadashi Yamaguchi (Renesas Electronics)
Hiroshi Yano (Univ. Tsukuba)
Yi Zhao (Zhejiang Univ.)